Unique High-Density Flex-Power Architecture Offers High Performance and Multi-Channel Configuration Flexibility
Marvin Test Solutions, Inc. announced the release of the new GX3116e, 16-Channel Device Power Supply (DPS) / Source Measure Unit (SMU).
The GX3116e DPS is the highest density, most flexible multichannel semiconductor device power supply solution available. The true 4-quadrant operation, isolated outputs, ganging capabilities for higher current, and extensive health monitoring and alarms make this the ideal solution for a multitude of semiconductor test applications.
Kelvin connection sensing on a per-channel basis ensures that the Device Under Test (DUT) receives the expected excitation levels, independent of cabling and other interconnects, while over-current sensing and programmable alarms protect the device under test. Electrically isolated outputs, grouped in banks of eight channels, can be ganged together to achieve higher current levels, and both banks can be ganged together to extend the total overall output current.
“This latest addition to our Semiconductor product portfolio delivers the performance and flexibility that our customers demand their evolving semiconductor test needs,” said Major General Stephen T. Sargeant, USAF (Ret.), CEO of Marvin Test Solutions. “The GX3116e combines unmatched channel density with exceptional source/measure performance, making it ideal for a wide range of current and emerging semiconductor test applications.”
The GX3116e is supplied with a full-featured virtual instrument panel that can be used to interactively program and control the instrument, as well as full documentation and online help files. We also deliver GtLinux, a software package providing support for Linux 32/64 operating systems.